Cleanup support

Various test head/probe card connections

Loader: 2 loaders/automation support with AMHS

Head tilting device (probe clamp tilting device)

Chuck: normal temperature/high temperature/low temperature/(each low noise)

APC: The probe card is automatically replaced

Box ID reader

Wafer ID reader (front/back)

GB-IB ports

Wafer detector Network System (Veganet, Light-Veganet, Vega-Planet, GEM)

PCAS (probe card automatic setting)

Probe card PGV